The new approach to education quality estimation from creativity and the knowledge processes virtualization positions, offered by authors, has allowed to receive the original model of an estimation given by parametric set of equations:
(1)
Where Hε - epsilon-entropy per knowledge quantum; ε2 - average square of information field of training creation error; - capacity of knowledge quantum; p - capacity of knowledge spectrum quantum. In this case it is considered, that the information field of training has quantum character, i.e. it may be represented as a collection of knowledge quantum. Knowledge quantum can be treated as a grain size of knowledge field investigated by concrete discipline, appropriate to installed preparation requirements. Obtained model (1) opens possibility of additional parameters introduction, permitting to carry out a complex estimation of educational systems. To these parameters it is possible to relate: phase space of a group estimation, space of an individual estimation, active estimation. The active estimation is understood as an estimation of training quality, which simultaneously quantitatively allows estimating possibilities of this quality improvement. In other words the active estimation does not only characterizes quality of learning process, but also allows to carry out the quantitative forecast of efforts on this process perfecting.
The spent researches allowed to develop a common technique of educational systems quality complex estimation and to create on its basis the set of program complexes; the interface of one is given on fig. 1.
Drawing 1.
It is necessary to mark, that possibilities of offered technique are not limited by obtained results, and have defined potential of development. Now in this direction intensive researches are spent and they show quite encouraging results. It concerns also to a problem of experimental definition of knowledge quantum. Rather simple methods of this problem solution already are obtained.
Работа представлена на научный конгресс с международным участием «Высокие технологии», 5-8 ноября 2004 г., г. Париж, Франция